Michael Walker

Coming to Mines with nearly 20 years of experience in the Semiconductor industry, Michael joined Dr. Packard’s group as a TOF-SIMS specialist tasked with running and maintaining Mines’ brand new ION-TOF 5 instrument to assist students with their research projects.  Michael has worked at Motorola, Texas Instruments and Samsung Austin Semiconductor in such areas as Diffusion, Failure Analysis, Yield Enhancement, Research and Development and, most recently, eight years in the Surface Analysis field utilizing TOF-SIMS, MS-SIMS, XPS, AES, and AFM to support the manufacturing of integrated circuits. In addition to his work in the field of technology, Michael also enjoys exploring his creative side.  He is a published fiction writer and has experience in the video and film industry as a Writer, Producer, Director, Assistant Director, Editor, Script Supervisor, Cameraman, and Production Assistant.  He also enjoys spending his free time at home making all kinds of fun things with his two 3D printers, laser etcher, and CNC wood carver.

Publications

Utilizing (Al, Ga)₂O₃/Ga₂O₃ superlattices to measure cation vacancy diffusion and vacancy-concentration-dependent diffusion of Al, Sn, and Fe in β-Ga₂O₃

ResearchGate

Sputter-deposited CdMgTe for rear contact to CdSeTe/CdTe solar cells

Characterization of thin CdTe solar cells with a CdSeTe front layer

Mitigating Measurement Artifacts in TOF-SIMS Analysis of Perovskite Solar Cells

Stable magnesium zinc oxide by reactive Co-Sputtering for CdTe-based solar cells

The formation of oriented barium carbonate from the decomposition of yttria-doped barium zirconate films

Oxide Stability Analysis and Characterization in a Galvannealed Dual-Phase Steel Exhibiting Coating Defects

Investigation of the Electrical Properties of Grain Boundaries in (AgxCu1-x)(InyGa1-y)Se2